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ietf-tools · Mar 7, 2024 · fdd1d14 · fdd1d14
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diff --git a/data/ANSI_C63.4-2014.yaml b/data/ANSI_C63.4-2014.yaml
@@ -1030,6 +1030,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.4-2009
+    docid:
+    - id: ANSI C63.4-2009
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.4-2009
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: ANSI standards
 - content: Noise measurement

diff --git a/data/ANSI_C63.4-2014_REDLINE.yaml b/data/ANSI_C63.4-2014_REDLINE.yaml
@@ -1029,6 +1029,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.4-2009
+    docid:
+    - id: ANSI C63.4-2009
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.4-2009
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: ANSI Standards
 - content: Electric variables measurement

diff --git a/data/EEE_1671.1-2017.yaml b/data/EEE_1671.1-2017.yaml
@@ -476,6 +476,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1671.1-2009
+    docid:
+    - id: IEEE 1671.1-2009
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1671.1-2009
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: XML

diff --git a/data/IEC_IEEE_60780.yaml b/data/IEC_IEEE_60780.yaml
@@ -1387,6 +1387,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE323-2003
+    docid:
+    - id: IEEE 323-2003
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 323-2003
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE323-2003
+    docid:
+    - id: IEEE 323-2003
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 323-2003
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: IEC Standards

diff --git a/data/IEC_IEEE_62271.37-013-2015.yaml b/data/IEC_IEEE_62271.37-013-2015.yaml
@@ -443,6 +443,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.013-1997
+    docid:
+    - id: IEEE C37.013-1997
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.013-1997
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: IEC Standards

diff --git a/data/IEC_IEEE_CD_P62395.1-2022-04.yaml b/data/IEC_IEEE_CD_P62395.1-2022-04.yaml
@@ -485,6 +485,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE515-2017
+    docid:
+    - id: IEEE 515-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 515-2017
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: IEC Standards

diff --git a/data/IEC_IEEE_CD_P62395.1-2022-12.yaml b/data/IEC_IEEE_CD_P62395.1-2022-12.yaml
@@ -383,6 +383,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE515-2017
+    docid:
+    - id: IEEE 515-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 515-2017
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE515-2017
+    docid:
+    - id: IEEE 515-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 515-2017
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: IEC Standards

diff --git a/data/IEEE_1.202X_D-4-2023-12.yaml b/data/IEEE_1.202X_D-4-2023-12.yaml
@@ -326,6 +326,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1003.1-2017
+    docid:
+    - id: IEEE 1003.1-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1003.1-2017
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1003.1-2017
+    docid:
+    - id: IEEE 1003.1-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1003.1-2017
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Operating systems

diff --git a/data/IEEE_1.202X_D-4.1-2024-02.yaml b/data/IEEE_1.202X_D-4.1-2024-02.yaml
@@ -122,6 +122,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1003.1-2017
+    docid:
+    - id: IEEE 1003.1-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1003.1-2017
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Information technology

diff --git a/data/IEEE_1076-2008.yaml b/data/IEEE_1076-2008.yaml
@@ -300,6 +300,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1076-2002
+    docid:
+    - id: IEEE 1076-2002
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1076-2002
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Hardware design languages

diff --git a/data/IEEE_1076-2008_REDLINE.yaml b/data/IEEE_1076-2008_REDLINE.yaml
@@ -302,6 +302,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1076-2002
+    docid:
+    - id: IEEE 1076-2002
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1076-2002
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE standards
 - content: Computer languages

diff --git a/data/IEEE_1076C-2007.yaml b/data/IEEE_1076C-2007.yaml
@@ -524,6 +524,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1076-2002
+    docid:
+    - id: IEEE 1076-2002
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1076-2002
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Trademarks

diff --git a/data/IEEE_11073.10101A-2015.yaml b/data/IEEE_11073.10101A-2015.yaml
@@ -464,6 +464,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ISO-IEEE11073.10101-2004
+    docid:
+    - id: ISO/IEEE 11073.10101-2004
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ISO/IEEE 11073.10101-2004
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Haemodynamics