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ietf-tools · Feb 15, 2024 · 52843f1 · 52843f1
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diff --git a/data/ANSI_C63.4-2014.yaml b/data/ANSI_C63.4-2014.yaml
@@ -214,6 +214,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.4-2009
+    docid:
+    - id: ANSI C63.4-2009
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.4-2009
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: ANSI standards
 - content: Noise measurement

diff --git a/data/ANSI_C63.4-2014_REDLINE.yaml b/data/ANSI_C63.4-2014_REDLINE.yaml
@@ -213,6 +213,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.4-2009
+    docid:
+    - id: ANSI C63.4-2009
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.4-2009
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: ANSI Standards
 - content: Electric variables measurement

diff --git a/data/ANSI_IEEE_802.11-1999.yaml b/data/ANSI_IEEE_802.11-1999.yaml
@@ -203,6 +203,33 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: obsoletedBy
+  bibitem:
+    id: IEEEP802.11-D-4.0-R-ma
+    docid:
+    - id: IEEE P802.11/D-4.0/R-ma
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE P802.11/D-4.0/R-ma
+      format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE802.11-1997
+    docid:
+    - id: IEEE 802.11-1997
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 802.11-1997
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 - type: updates
   bibitem:
     id: IEEE802.11-1997

diff --git a/data/ANSI_USEMCSC_C63.2-2023.yaml b/data/ANSI_USEMCSC_C63.2-2023.yaml
@@ -366,6 +366,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.2-2016
+    docid:
+    - id: ANSI C63.2-2016
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.2-2016
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Electromagnetic interference

diff --git a/data/EEE_1671.1-2017.yaml b/data/EEE_1671.1-2017.yaml
@@ -136,6 +136,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1671.1-2009
+    docid:
+    - id: IEEE 1671.1-2009
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1671.1-2009
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: XML

diff --git a/data/IEC_61523.1-2023.yaml b/data/IEC_61523.1-2023.yaml
@@ -184,6 +184,16 @@ relation:
     formattedref:
       content: IEEE 1481-2019
       format: text/plain
+- type: adoptedFrom
+  bibitem:
+    id: IEEE1481-2019
+    docid:
+    - id: IEEE 1481-2019
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1481-2019
+      format: text/plain
 keyword:
 - content: IEEE Standards
 - content: IEC Standards

diff --git a/data/IEC_61523.4-2023.yaml b/data/IEC_61523.4-2023.yaml
@@ -243,6 +243,16 @@ relation:
     formattedref:
       content: IEEE 1801-2018
       format: text/plain
+- type: adoptedFrom
+  bibitem:
+    id: IEEE1801-2018
+    docid:
+    - id: IEEE 1801-2018
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1801-2018
+      format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Low-power electronics

diff --git a/data/IEC_62530.2-2023.yaml b/data/IEC_62530.2-2023.yaml
@@ -185,6 +185,16 @@ relation:
     formattedref:
       content: IEEE 1800.2-2020
       format: text/plain
+- type: adoptedFrom
+  bibitem:
+    id: IEEE1800.2-2020
+    docid:
+    - id: IEEE 1800.2-2020
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1800.2-2020
+      format: text/plain
 keyword:
 - content: IEEE Standards
 - content: IEC Standards

diff --git a/data/IEC_63055-2023.yaml b/data/IEC_63055-2023.yaml
@@ -244,6 +244,16 @@ relation:
     formattedref:
       content: IEEE 2401-2019
       format: text/plain
+- type: adoptedFrom
+  bibitem:
+    id: IEEE2401-2019
+    docid:
+    - id: IEEE 2401-2019
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 2401-2019
+      format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Interoperability

diff --git a/data/IEC_IEEE_60780.yaml b/data/IEC_IEEE_60780.yaml
@@ -265,6 +265,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE323-2003
+    docid:
+    - id: IEEE 323-2003
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 323-2003
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE323-2003
+    docid:
+    - id: IEEE 323-2003
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 323-2003
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEC Standards
 - content: IEL Standards

diff --git a/data/IEC_IEEE_62271.37-013-2015.yaml b/data/IEC_IEEE_62271.37-013-2015.yaml
@@ -128,6 +128,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.013-1997
+    docid:
+    - id: IEEE C37.013-1997
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.013-1997
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: IEC Standards

diff --git a/data/IEC_IEEE_CD_P62395.1-2022-04.yaml b/data/IEC_IEEE_CD_P62395.1-2022-04.yaml
@@ -159,6 +159,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE515-2017
+    docid:
+    - id: IEEE 515-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 515-2017
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: IEC Standards

diff --git a/data/IEC_IEEE_CD_P62395.1-2022-12.yaml b/data/IEC_IEEE_CD_P62395.1-2022-12.yaml
@@ -145,6 +145,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE515-2017
+    docid:
+    - id: IEEE 515-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 515-2017
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE515-2017
+    docid:
+    - id: IEEE 515-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 515-2017
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: IEC Standards

diff --git a/data/IEEE_1.202X_D-4-2023-12.yaml b/data/IEEE_1.202X_D-4-2023-12.yaml
@@ -156,6 +156,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1003.1-2017
+    docid:
+    - id: IEEE 1003.1-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1003.1-2017
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Operating systems

diff --git a/data/IEEE_1076-2008.yaml b/data/IEEE_1076-2008.yaml
@@ -138,6 +138,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1076-2002
+    docid:
+    - id: IEEE 1076-2002
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1076-2002
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Hardware design languages

diff --git a/data/IEEE_1076-2008_REDLINE.yaml b/data/IEEE_1076-2008_REDLINE.yaml
@@ -142,6 +142,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1076-2002
+    docid:
+    - id: IEEE 1076-2002
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1076-2002
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE standards
 - content: Computer languages