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Add an option to define address incrementing value to speed up tests on bigger memory cards (ie: >64MB). This will help catch a faulty chip faster. Currently this can be done by testing different smaller address ranges, but a one click option would be nice.
The text was updated successfully, but these errors were encountered:
Add an option to define address incrementing value to speed up tests on bigger memory cards (ie: >64MB). This will help catch a faulty chip faster. Currently this can be done by testing different smaller address ranges, but a one click option would be nice.
The text was updated successfully, but these errors were encountered: